Understanding how dislocations (line defects in the crystal structure) occur when 3D-printing metals has been unclear to materials scientists. Understanding when and how dislocations form in ...

(Nanowerk News) An international team of researchers, led by Professor Yu Zou (MSE), is using electric fields to control the motion of material defects. This work has important implications for ...

An international team of researchers, led by University of Toronto Engineering Professor Yu Zou, is using electric fields to control the motion of material defects. This work has important ...

For materials scientists, understanding the atomic structure of a material, revealing defects, or characterizing the chemical and physical processes that occur during the creation of material, are key ...

SiC is extensively used in microelectronic devices owing to its several unique properties. However, low yield and high cost of the SiC manufacturing process are the major challenges that must be ...

TROY, NY—A promising semiconductor material could be improved if flaws previously thought irrelevant to performance are reduced, according to research published today in Nature Communications. A group ...

Silicon carbide (SiC) is a crystalline material utilized to develop a wide array of electronic devices, including transistors and other high-power, high-frequency, and high-temperature devices. As ...

Unpatterned wafer inspection, which has flown well under the radar for most of the semiconductor industry, is becoming more critical amid the need to find defects earlier in the manufacturing process ...